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CHNCHIP ENGINEERING CO.,LTD.

珠海市中芯集成電路有限公司
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  • STS8200B Tester

    STS8200B Tester

    晶圓測試

    0.00

    0.00

  • 3380P Tester

    3380P Tester

    晶圓測試

    0.00

    0.00

  • TR-6850

    TR-6850

    晶圓測試

    0.00

    0.00

  • TR-6836

    TR-6836

    晶圓測試

    0.00

    0.00

  • P12XL

    P12XL

    晶圓測試

    0.00

    0.00

  • UF200SA

    UF200SA

    晶圓測試

    0.00

    0.00

Equipment introduction
3380P tester

lMaximum data transfer rate: 100MHz

lMaximum I/OPIN: 512 channels

lSimultaneous measurement: maximum 512DUT parallel test

lMeasuring vector depth: 32M/64M/128M

lSTS8200B tester

lMaximum data transfer rate: 5MHz

lDigital-analog hybrid tester, the maximum analog voltage can support ????-1000V~+1000V

lMaximum 16/32DUT parallel test

lHigh scalability, wide coverage, can provide analog, linear, power management, audio, analog switches


TR6850 tester

lMaximum data transfer rate 33MHz, resolution 3.3ns

lDigital-analog hybrid tester, the maximum analog voltage can support -45V~+100V

lMaximum I/OPIN: 256 channels

lEach channel can set the input level separately (VIH/VIL)

lEach channel can set the comparison level (VOH/VOL) separately

lEach channel can independently set the clock modulation mode.

lEach channel can set TG separately

lEach channel can be used for time parameter measurement

lSimultaneous parallel testing of up to 8DUT

lMeasuring vector depth up to 8M


TR6836 tester

lMaximum data transfer rate 33MHz, resolution 3.3ns

lMaximum I/OPIN: 384 channels

lEach channel can set the input level separately (VIH/VIL)

lEach channel can set the comparison level (VOH/VOL) separately

lEach channel can independently set the clock modulation mode.

lEach channel can set TG separately

lEach channel can be used for time parameter measurement

lSimultaneous parallel testing of up to 8DUT

lMeasuring vector depth up to 8M


P12XL probe station
lJapanese TEL production
lTest 8"~12" wafers
lHigh accuracy (±2um within 300mm)
lHigh degree of automation, equipped with advanced CCD graphic scanning technology, the machine automatically loads and unloads films
lGood stability
UF200SA probe station

lJapan TSK production

lTest 5”~8” wafers

lHigh accuracy (±2um within 200mm)

lHigh degree of automation, equipped with advanced CCD graphic scanning technology, the machine automatically loads and unloads films

lGood stability


18款禁用软件app免费